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中文
High-altitude Applicability Test for China-made DNA Detection Devices
CAI Sifang, DING Xiaoxian, WANG Zhanhai, LI Ying, WU Bian
Forensic Science And Technology . 2019, (
1
): 83 -86 . DOI: 10.16467/j.1008-3650.2019.01.017
