High-altitude Applicability Test for China-made DNA Detection Devices

High-altitude Applicability Test for China-made DNA Detection Devices

CAI Sifang, DING Xiaoxian, WANG Zhanhai, LI Ying, WU Bian

Forensic Science and Technology ›› 2019, Vol. 44 ›› Issue (1) : 83-86. DOI: 10.16467/j.1008-3650.2019.01.017

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High-altitude Applicability Test for China-made DNA Detection Devices

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{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2019, 44(1): 83-86 https://doi.org/10.16467/j.1008-3650.2019.01.017

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