Technical Unlocking Tested by Scanning Electron Microscope/Energy Disperse Spectrometer

Technical Unlocking Tested by Scanning Electron Microscope/Energy Disperse Spectrometer

PENG Xugui, YANG Lunkun, DENG Qingqing, CAI Jin, RAN Chang, XIANG Hai, CHENG Nianqun

Forensic Science and Technology ›› 2019, Vol. 44 ›› Issue (5) : 457-459. DOI: 10.16467/j.1008-3650.2019.05.018

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Technical Unlocking Tested by Scanning Electron Microscope/Energy Disperse Spectrometer

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{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2019, 44(5): 457-459 https://doi.org/10.16467/j.1008-3650.2019.05.018

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